Event Detector System (Linked to Shock Testing Machine)
Event Detector System (Linked to Shock Testing Machine)
- In tests such as drop impact tests, where mechanical stress is applied at regular intervals, resistance value data is collected for 10 msec for each stress cycle (10,000 points at 1 μsec intervals). - In the standard configuration, it is possible to simultaneously collect, judge, and save data from up to 16 channels. - Instantaneous interruption detection and waveform information acquisition are executed simultaneously. - Collected list data and waveform data can also be analyzed using the included Viewer software. - Stress simulation services can also be proposed.
- Company：Wave Technology
- Price：Other
